Electron Microscopy

  1. Image Processing and Data Analysis
    1. Digital Image Acquisition
      1. Detector Types and Characteristics
        1. CCD Cameras
          1. Pixel Size and Array Size
            1. Quantum Efficiency
              1. Noise Characteristics
              2. CMOS Detectors
                1. Speed Advantages
                  1. Power Consumption
                  2. Direct Detection Cameras
                    1. Detective Quantum Efficiency
                      1. Modulation Transfer Function
                    2. Acquisition Parameters
                      1. Exposure Time Optimization
                        1. Binning Considerations
                          1. Frame Rate Selection
                          2. File Formats and Metadata
                            1. Standard Image Formats
                              1. Microscopy-Specific Formats
                                1. Metadata Preservation
                              2. Noise Reduction and Filtering
                                1. Types of Noise
                                  1. Shot Noise
                                    1. Thermal Noise
                                      1. Readout Noise
                                      2. Spatial Domain Filtering
                                        1. Linear Filters
                                          1. Gaussian Smoothing
                                            1. Mean Filters
                                            2. Non-Linear Filters
                                              1. Median Filters
                                                1. Morphological Filters
                                              2. Frequency Domain Filtering
                                                1. Fourier Transform Applications
                                                  1. Low-Pass and High-Pass Filters
                                                    1. Band-Pass Filtering
                                                  2. Fourier Transforms and Analysis
                                                    1. Power Spectrum Analysis
                                                      1. Frequency Domain Representation
                                                        1. Noise Analysis
                                                          1. Periodic Structure Detection
                                                          2. Lattice Analysis
                                                            1. Lattice Parameter Measurement
                                                              1. Strain Analysis
                                                              2. Defect Analysis
                                                                1. Dislocation Characterization
                                                                  1. Grain Boundary Analysis
                                                                2. Image Simulation
                                                                  1. Multislice Method
                                                                    1. Slice Thickness Selection
                                                                      1. Propagation Calculations
                                                                      2. Bloch Wave Method
                                                                        1. Eigenvalue Solutions
                                                                          1. Systematic Reflections
                                                                          2. Comparison with Experimental Images
                                                                            1. Parameter Optimization
                                                                              1. Structure Refinement
                                                                            2. Quantitative Measurements
                                                                              1. Particle Size Analysis
                                                                                1. Thresholding and Segmentation
                                                                                  1. Automatic Thresholding
                                                                                    1. Manual Segmentation
                                                                                    2. Size Distribution Analysis
                                                                                      1. Statistical Parameters
                                                                                        1. Distribution Fitting
                                                                                      2. Phase Fraction Quantification
                                                                                        1. Image Binarization
                                                                                          1. Area Fraction Measurement
                                                                                            1. Volume Fraction Calculation
                                                                                            2. Crystallographic Measurements
                                                                                              1. Lattice Parameter Determination
                                                                                                1. Orientation Analysis
                                                                                                  1. Strain Measurement
                                                                                                2. 3D Reconstruction and Visualization
                                                                                                  1. Tomographic Reconstruction
                                                                                                    1. Reconstruction Algorithms
                                                                                                      1. Artifact Reduction
                                                                                                      2. Volume Rendering
                                                                                                        1. Visualization Techniques
                                                                                                          1. Transparency and Color Mapping
                                                                                                          2. Surface and Mesh Generation
                                                                                                            1. Isosurface Extraction
                                                                                                              1. Mesh Optimization
                                                                                                            2. Data Management and Archiving
                                                                                                              1. Metadata Standards
                                                                                                                1. Microscopy Metadata Standards
                                                                                                                  1. Data Provenance
                                                                                                                  2. Long-Term Storage Solutions
                                                                                                                    1. File Format Considerations
                                                                                                                      1. Data Integrity
                                                                                                                      2. Data Sharing and Collaboration
                                                                                                                        1. Database Systems
                                                                                                                          1. Remote Access Protocols

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                                                                                                                      7. Advanced and Specialized Techniques

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                                                                                                                      1. Fundamentals of Electron Microscopy