Electron Microscopy

  1. Transmission Electron Microscopy
    1. Operating Principles
      1. Parallel Beam Illumination
        1. Coherence Requirements
          1. Spatial Coherence
            1. Temporal Coherence
            2. Illumination System Design
              1. Condenser Lens Configuration
                1. Aperture Selection
              2. Electron Transmission Through Thin Specimens
                1. Thickness Requirements
                  1. Electron Transparency Criteria
                    1. Thickness vs Resolution Trade-offs
                    2. Multiple Scattering Effects
                      1. Dynamical Scattering Theory
                        1. Thickness-Dependent Contrast
                    3. TEM Instrumentation
                      1. Specimen Holder Systems
                        1. Single Tilt Holders
                          1. Tilt Range and Accuracy
                            1. Mechanical Stability
                            2. Double Tilt Holders
                              1. Eucentric Tilting
                                1. Crystallographic Applications
                                2. Specialized Holders
                                  1. Cryo Holders
                                    1. Temperature Control
                                      1. Anti-Contamination Systems
                                      2. Heating Holders
                                        1. Temperature Range
                                          1. In-Situ Studies
                                          2. Straining Holders
                                            1. Mechanical Testing
                                              1. Deformation Studies
                                          3. Viewing Screen and Detectors
                                            1. Fluorescent Screens
                                              1. Phosphor Materials
                                                1. Resolution and Sensitivity
                                                2. Digital Detectors
                                                  1. CCD Cameras
                                                    1. Pixel Size and Resolution
                                                      1. Dynamic Range
                                                      2. CMOS Detectors
                                                        1. Speed Advantages
                                                          1. Noise Characteristics
                                                          2. Direct Detection Cameras
                                                            1. Electron Counting
                                                              1. High Speed Imaging
                                                          3. Vacuum and Anti-Contamination Systems
                                                            1. Specimen Area Vacuum
                                                              1. Differential Pumping
                                                                1. Contamination Sources
                                                                2. Anti-Contamination Devices
                                                                  1. Cold Traps
                                                                    1. Plasma Cleaning
                                                                3. Image Formation and Contrast Mechanisms
                                                                  1. Mass-Thickness Contrast
                                                                    1. Scattering Cross-Section Dependence
                                                                      1. Dependence on Atomic Number and Thickness
                                                                        1. Quantitative Analysis Applications
                                                                        2. Diffraction Contrast
                                                                          1. Crystal Orientation Effects
                                                                            1. Bragg Condition Satisfaction
                                                                              1. Orientation-Dependent Intensity
                                                                              2. Dislocation Imaging
                                                                                1. Strain Field Contrast
                                                                                  1. Invisibility Criteria
                                                                                  2. Bend Contours
                                                                                    1. Local Orientation Changes
                                                                                      1. Thickness Variations
                                                                                    2. Phase Contrast
                                                                                      1. Interference Effects
                                                                                        1. Wave Function Interference
                                                                                          1. Phase Relationships
                                                                                          2. High-Resolution Imaging
                                                                                            1. Lattice Fringe Formation
                                                                                              1. Structure Image Interpretation
                                                                                              2. Weak Phase Object Approximation
                                                                                                1. Linear Image Formation
                                                                                                  1. Phase Contrast Transfer Function
                                                                                                2. Amplitude Contrast
                                                                                                  1. Absorption Effects
                                                                                                    1. Scattering Amplitude Variations
                                                                                                  2. TEM Imaging Modes
                                                                                                    1. Bright-Field Imaging
                                                                                                      1. Principle and Setup
                                                                                                        1. Direct Beam Selection
                                                                                                          1. Aperture Positioning
                                                                                                          2. Applications
                                                                                                            1. General Morphology
                                                                                                              1. Thickness Variations
                                                                                                              2. Contrast Interpretation
                                                                                                                1. Mass-Thickness Effects
                                                                                                                  1. Diffraction Contributions
                                                                                                                2. Dark-Field Imaging
                                                                                                                  1. Centered Dark-Field
                                                                                                                    1. Selection of Diffracted Beams
                                                                                                                      1. Beam Tilting Method
                                                                                                                        1. Aperture Displacement Method
                                                                                                                        2. Applications
                                                                                                                          1. Crystal Defect Analysis
                                                                                                                            1. Precipitate Identification
                                                                                                                            2. Weak-Beam Dark-Field
                                                                                                                              1. High-Resolution Defect Imaging
                                                                                                                                1. Dislocation Core Structure
                                                                                                                                  1. Experimental Setup Requirements
                                                                                                                                2. High-Resolution TEM
                                                                                                                                  1. Lattice Imaging
                                                                                                                                    1. Atomic Structure Visualization
                                                                                                                                      1. Resolution Requirements
                                                                                                                                      2. Phase Contrast Imaging
                                                                                                                                        1. Image Simulation and Interpretation
                                                                                                                                          1. Structure Factor Considerations
                                                                                                                                          2. Instrumental Requirements
                                                                                                                                            1. Aberration Correction
                                                                                                                                              1. Stability Requirements
                                                                                                                                            2. Annular Dark-Field Imaging in TEM
                                                                                                                                              1. Hollow Cone Illumination
                                                                                                                                                1. Incoherent Imaging Conditions
                                                                                                                                                  1. Z-Contrast Applications
                                                                                                                                                2. Electron Diffraction in TEM
                                                                                                                                                  1. Selected Area Electron Diffraction
                                                                                                                                                    1. Area Selection Principles
                                                                                                                                                      1. Aperture Size and Position
                                                                                                                                                        1. Specimen Area Definition
                                                                                                                                                        2. Pattern Acquisition
                                                                                                                                                          1. Camera Length Selection
                                                                                                                                                            1. Exposure Optimization
                                                                                                                                                            2. Diffraction Pattern Types
                                                                                                                                                              1. Single Crystal Patterns
                                                                                                                                                                1. Polycrystalline Patterns
                                                                                                                                                                  1. Amorphous Patterns
                                                                                                                                                                2. Convergent Beam Electron Diffraction
                                                                                                                                                                  1. Convergent Probe Formation
                                                                                                                                                                    1. Fine Structure Analysis
                                                                                                                                                                      1. Higher Order Laue Zone Lines
                                                                                                                                                                        1. Symmetry Determination
                                                                                                                                                                        2. Thickness Measurement
                                                                                                                                                                          1. Thickness Fringes
                                                                                                                                                                            1. Quantitative Analysis
                                                                                                                                                                          2. Analysis of Diffraction Patterns
                                                                                                                                                                            1. Indexing Patterns
                                                                                                                                                                              1. Zone Axis Determination
                                                                                                                                                                                1. Miller Index Assignment
                                                                                                                                                                                2. Determining Crystal Structure and Orientation
                                                                                                                                                                                  1. Lattice Parameter Measurement
                                                                                                                                                                                    1. Space Group Determination
                                                                                                                                                                                      1. Identification of Defects
                                                                                                                                                                                        1. Stacking Faults
                                                                                                                                                                                          1. Twin Boundaries
                                                                                                                                                                                            1. Dislocations

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                                                                                                                                                                                    2. General Instrumentation of Electron Microscopes

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                                                                                                                                                                                    4. Scanning Electron Microscopy