Electron Microscopy

  1. Advanced and Specialized Techniques
    1. Scanning Transmission Electron Microscopy
      1. Principle of Convergent Probe
        1. Probe Formation and Control
          1. Condenser System Design
            1. Probe Size Optimization
            2. Scanning System
              1. Beam Deflection Control
                1. Scan Synchronization
              2. Annular Dark-Field Imaging
                1. High-Angle Annular Dark-Field
                  1. Z-Contrast Imaging
                    1. Atomic Number Sensitivity
                      1. Incoherent Imaging Conditions
                      2. Detector Geometry
                        1. Collection Angles
                          1. Inner and Outer Radii
                        2. Low-Angle ADF
                          1. Diffraction Contrast
                            1. Crystal Defect Imaging
                          2. Annular Bright-Field Imaging
                            1. Light Element Imaging
                              1. Phase Contrast Enhancement
                                1. Atomic Column Visibility
                                2. Detector Configuration
                                  1. Central Beam Collection
                                    1. Coherent Imaging Conditions
                                  2. Combining STEM with Spectroscopy
                                    1. Simultaneous Imaging and EELS
                                      1. Spectrum Imaging
                                        1. Chemical Mapping
                                        2. STEM-EDS Analysis
                                          1. High Spatial Resolution Analysis
                                            1. Quantitative Mapping
                                        3. Cryo-Electron Microscopy
                                          1. Vitrification of Samples
                                            1. Plunge Freezing
                                              1. Rapid Cooling Rates
                                                1. Ice Crystal Prevention
                                                  1. Grid Preparation
                                                  2. High-Pressure Freezing
                                                    1. Thick Sample Vitrification
                                                      1. Pressure-Temperature Relationships
                                                    2. Single Particle Analysis
                                                      1. Particle Picking and Selection
                                                        1. Automated Picking Algorithms
                                                          1. Manual Selection Criteria
                                                          2. Image Processing
                                                            1. Particle Alignment
                                                              1. Classification Methods
                                                              2. 3D Reconstruction
                                                                1. Angular Reconstitution
                                                                  1. Resolution Assessment
                                                                2. Cryo-Electron Tomography
                                                                  1. Tilt Series Acquisition
                                                                    1. Angular Range and Increment
                                                                      1. Dose Fractionation
                                                                      2. Tomogram Reconstruction
                                                                        1. Back-Projection Methods
                                                                          1. Iterative Reconstruction
                                                                          2. Sub-Tomogram Averaging
                                                                            1. Structure Determination
                                                                              1. Resolution Enhancement
                                                                            2. Sample Handling and Transfer
                                                                              1. Cryo-Transfer Systems
                                                                                1. Anti-Contamination Protocols
                                                                                  1. Temperature Maintenance
                                                                                2. Electron Tomography
                                                                                  1. Principle of Tilt Series Acquisition
                                                                                    1. Angular Range and Limitations
                                                                                      1. Missing Wedge Problem
                                                                                        1. Specimen Thickness Effects
                                                                                        2. Tilt Increment Optimization
                                                                                          1. Sampling Requirements
                                                                                            1. Dose Distribution
                                                                                          2. 3D Reconstruction Algorithms
                                                                                            1. Weighted Back Projection
                                                                                              1. Filter Selection
                                                                                                1. Noise Considerations
                                                                                                2. Iterative Reconstruction Methods
                                                                                                  1. SIRT Algorithm
                                                                                                    1. ART Methods
                                                                                                    2. Alignment Procedures
                                                                                                      1. Fiducial Marker Tracking
                                                                                                        1. Cross-Correlation Methods
                                                                                                      2. Applications
                                                                                                        1. Materials Science Applications
                                                                                                          1. Pore Structure Analysis
                                                                                                            1. Defect Characterization
                                                                                                            2. Life Sciences Applications
                                                                                                              1. Cellular Ultrastructure
                                                                                                                1. Organelle Architecture
                                                                                                            3. Electron Backscatter Diffraction
                                                                                                              1. Kikuchi Pattern Formation
                                                                                                                1. Diffraction Geometry
                                                                                                                  1. Bragg Condition Satisfaction
                                                                                                                    1. Pattern Projection
                                                                                                                    2. Pattern Indexing
                                                                                                                      1. Hough Transform Method
                                                                                                                        1. Band Detection Algorithms
                                                                                                                      2. Microstructure Analysis
                                                                                                                        1. Grain Boundary Mapping
                                                                                                                          1. Misorientation Analysis
                                                                                                                            1. Boundary Character Distribution
                                                                                                                            2. Texture Analysis
                                                                                                                              1. Pole Figure Construction
                                                                                                                                1. Orientation Distribution Functions
                                                                                                                                2. Phase Identification
                                                                                                                                  1. Multi-Phase Materials
                                                                                                                                    1. Phase Fraction Determination
                                                                                                                                  2. Data Processing and Analysis
                                                                                                                                    1. Orientation Mapping
                                                                                                                                      1. Statistical Analysis
                                                                                                                                        1. Correlation with Other Techniques
                                                                                                                                      2. Low-Voltage Electron Microscopy
                                                                                                                                        1. Principles and Advantages
                                                                                                                                          1. Reduced Beam Damage
                                                                                                                                            1. Enhanced Surface Sensitivity
                                                                                                                                              1. Improved Contrast
                                                                                                                                              2. Instrumental Considerations
                                                                                                                                                1. Aberration Effects
                                                                                                                                                  1. Resolution Limitations
                                                                                                                                                    1. Detector Efficiency
                                                                                                                                                    2. Applications
                                                                                                                                                      1. Biological Specimens
                                                                                                                                                        1. Beam-Sensitive Materials
                                                                                                                                                          1. Surface Analysis
                                                                                                                                                        2. In-Situ Microscopy
                                                                                                                                                          1. Heating and Cooling Stages
                                                                                                                                                            1. Temperature Control Systems
                                                                                                                                                              1. Heating Elements
                                                                                                                                                                1. Temperature Measurement
                                                                                                                                                                2. Environmental Control
                                                                                                                                                                  1. Gas Introduction
                                                                                                                                                                    1. Pressure Control
                                                                                                                                                                  2. Straining Holders
                                                                                                                                                                    1. Mechanical Testing Capabilities
                                                                                                                                                                      1. Tensile Testing
                                                                                                                                                                        1. Compression Testing
                                                                                                                                                                        2. Real-Time Deformation Studies
                                                                                                                                                                          1. Dislocation Dynamics
                                                                                                                                                                            1. Crack Propagation
                                                                                                                                                                          2. Liquid and Gas Environmental Cells
                                                                                                                                                                            1. Cell Design and Sealing
                                                                                                                                                                              1. Membrane Windows
                                                                                                                                                                                1. Pressure Containment
                                                                                                                                                                                2. Dynamic Studies
                                                                                                                                                                                  1. Chemical Reactions
                                                                                                                                                                                    1. Phase Transformations
                                                                                                                                                                                    2. Correlative Techniques
                                                                                                                                                                                      1. Simultaneous Analysis Methods
                                                                                                                                                                                        1. Multi-Modal Imaging

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                                                                                                                                                                                  6. Analytical Electron Microscopy

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                                                                                                                                                                                  8. Image Processing and Data Analysis