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Physics
Condensed Matter and Materials Physics
Electron Microscopy
1. Fundamentals of Electron Microscopy
2. General Instrumentation of Electron Microscopes
3. Transmission Electron Microscopy
4. Scanning Electron Microscopy
5. Specimen Preparation
6. Analytical Electron Microscopy
7. Advanced and Specialized Techniques
8. Image Processing and Data Analysis
Scanning Electron Microscopy
Operating Principles
Focused Electron Beam Probing
Beam Spot Size and Resolution
Probe Size Limitations
Resolution Factors
Beam Current Considerations
Signal-to-Noise Ratio
Specimen Damage
Raster Scanning
Scan Patterns and Control
Line Scanning
Frame Scanning
Dwell Time and Pixel Size
Image Quality Factors
Acquisition Speed
Signal Detection for Image Formation
Signal Types and Collection
Simultaneous Multi-Signal Detection
Signal Processing
SEM Instrumentation
Scan Coils
Beam Deflection and Control
Magnetic Deflection System
Scan Amplifiers
Scan Distortion Correction
Linearity Adjustments
Geometric Corrections
Specimen Chamber and Stage
Stage Movement and Control
X-Y Translation
Z-Height Adjustment
Tilt and Rotation
Eucentric Stage Design
Tilt Axis Alignment
Working Distance Optimization
Environmental Control
Temperature Control
Gas Introduction Systems
Signal Detectors
Everhart-Thornley Detector
Working Principle
Scintillator-Photomultiplier Design
Bias Voltage Effects
Signal Amplification
Light Pipe Coupling
PMT Gain Control
Collection Efficiency
Geometric Factors
Energy Filtering
Solid-State Detectors
Semiconductor Detector Design
Energy and Angle Sensitivity
Backscattered Electron Detection
Compositional Imaging
Topographical Effects
In-Lens Detectors
High-Resolution Imaging
Low Voltage Applications
Signal Collection Geometry
X-ray Detectors
Energy-Dispersive Detectors
Wavelength-Dispersive Detectors
Detector Positioning and Geometry
SEM Imaging and Contrast
Topographical Contrast
Surface Morphology Visualization
Shadow Effects
Edge Enhancement
Secondary Electron Imaging
Surface Sensitivity
Topographical Information
Compositional Contrast
Backscattered Electron Imaging
Atomic Number Contrast
Phase Identification
Quantitative Compositional Analysis
Standards and Calibration
Matrix Effects
Edge Effect and Shadowing
Geometric Effects
Signal Collection Efficiency
Charging Effects and Mitigation
Charge Accumulation Mechanisms
Coating Strategies
Low Voltage Imaging
Variable Pressure Techniques
Environmental SEM
Principles and Advantages
Imaging of Wet and Non-Conductive Samples
Natural State Observation
Dynamic Process Studies
Gas Environment Effects
Gas Amplification
Pressure Limitations
Gaseous Detection Systems
Gaseous Secondary Electron Detector
Gas Amplification Mechanism
Pressure Range Operation
Environmental Detector Design
Electrode Configuration
Signal Collection
Pressure Control and Sample Hydration
Differential Pumping Systems
Peltier Cooling Stages
Humidity Control
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3. Transmission Electron Microscopy
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5. Specimen Preparation