Electron Microscopy

  1. Analytical Electron Microscopy
    1. Spectroscopy Techniques Overview
      1. Analytical Methods Integration
        1. Simultaneous Imaging and Analysis
          1. Complementary Techniques
          2. Spatial and Spectral Resolution
            1. Probe Size Limitations
              1. Detection Limits
                1. Resolution Trade-offs
              2. Energy-Dispersive X-ray Spectroscopy
                1. Principles of X-ray Generation
                  1. Characteristic X-ray Production
                    1. Inner Shell Ionization
                      1. Electron Transitions
                      2. Continuum X-ray Generation
                        1. Bremsstrahlung Process
                          1. Energy Distribution
                        2. Detector Systems
                          1. Silicon Drift Detectors
                            1. Operating Principles
                              1. Performance Characteristics
                                1. Cooling Requirements
                                2. Si(Li) Detectors
                                  1. Construction and Operation
                                    1. Resolution and Count Rate
                                      1. Maintenance Requirements
                                    2. Qualitative Analysis
                                      1. Peak Identification
                                        1. X-ray Line Energies
                                          1. Peak Overlap Resolution
                                          2. Spectral Artifacts
                                            1. Escape Peaks
                                              1. Sum Peaks
                                                1. System Peaks
                                              2. Quantitative Analysis
                                                1. Standardless Quantification
                                                  1. Theoretical Standards
                                                    1. Accuracy Limitations
                                                    2. Matrix Corrections
                                                      1. ZAF Corrections
                                                        1. Phi-Rho-Z Method
                                                        2. Thin Film Analysis
                                                          1. Cliff-Lorimer Method
                                                            1. Absorption Corrections
                                                          2. Elemental Mapping
                                                            1. Mapping Techniques
                                                              1. Spectrum Imaging
                                                                1. X-ray Maps
                                                                2. Data Processing
                                                                  1. Background Subtraction
                                                                    1. Peak Deconvolution
                                                                    2. Data Interpretation
                                                                      1. Spatial Resolution Considerations
                                                                        1. Statistical Significance
                                                                      2. Limitations and Artifacts
                                                                        1. Light Element Detection
                                                                          1. Beam Damage Effects
                                                                            1. Contamination Issues
                                                                          2. Wavelength-Dispersive X-ray Spectroscopy
                                                                            1. Principles and Instrumentation
                                                                              1. Crystal Diffraction for X-ray Selection
                                                                                1. Bragg's Law Application
                                                                                  1. Crystal Spectrometer Design
                                                                                  2. Detector Systems
                                                                                    1. Gas Proportional Counters
                                                                                      1. Scintillation Detectors
                                                                                    2. Comparison with EDS
                                                                                      1. Resolution Advantages
                                                                                        1. Peak Separation Capability
                                                                                          1. Light Element Analysis
                                                                                          2. Sensitivity Considerations
                                                                                            1. Detection Limits
                                                                                              1. Count Rate Limitations
                                                                                            2. Applications in Microanalysis
                                                                                              1. Trace Element Detection
                                                                                                1. Light Element Quantification
                                                                                                  1. High Precision Analysis
                                                                                                2. Electron Energy Loss Spectroscopy
                                                                                                  1. Principles of Inelastic Scattering Measurement
                                                                                                    1. Energy Loss Processes
                                                                                                      1. Plasmon Excitation
                                                                                                        1. Core Shell Ionization
                                                                                                          1. Phonon Interactions
                                                                                                          2. Cross-Section Considerations
                                                                                                            1. Scattering Probability
                                                                                                              1. Angular Dependence
                                                                                                            2. EELS Spectrometer Design
                                                                                                              1. Magnetic Prism Spectrometers
                                                                                                                1. Dispersion Characteristics
                                                                                                                  1. Energy Resolution
                                                                                                                  2. Parallel Detection Systems
                                                                                                                    1. CCD Array Detectors
                                                                                                                      1. Electron Counting
                                                                                                                    2. Spectrum Analysis
                                                                                                                      1. Zero-Loss Peak
                                                                                                                        1. Instrumental Resolution
                                                                                                                          1. Energy Calibration
                                                                                                                          2. Low-Loss Region
                                                                                                                            1. Plasmon Analysis
                                                                                                                              1. Bulk Plasmons
                                                                                                                                1. Surface Plasmons
                                                                                                                                2. Band Gap Measurements
                                                                                                                                  1. Dielectric Function Determination
                                                                                                                                  2. Core-Loss Region
                                                                                                                                    1. Elemental Identification
                                                                                                                                      1. Ionization Edges
                                                                                                                                        1. Edge Onset Determination
                                                                                                                                        2. Chemical Information
                                                                                                                                          1. Oxidation State Analysis
                                                                                                                                            1. Bonding Environment
                                                                                                                                            2. Fine Structure Analysis
                                                                                                                                              1. ELNES Analysis
                                                                                                                                                1. EXELFS Analysis
                                                                                                                                            3. Energy-Filtered TEM
                                                                                                                                              1. Imaging Modes
                                                                                                                                                1. Zero-Loss Imaging
                                                                                                                                                  1. Inelastic Imaging
                                                                                                                                                  2. Elemental Mapping
                                                                                                                                                    1. Three-Window Method
                                                                                                                                                      1. Jump-Ratio Maps
                                                                                                                                                      2. Chemical Mapping
                                                                                                                                                        1. Core-Loss Maps
                                                                                                                                                          1. Plasmon Maps
                                                                                                                                                        2. Quantitative Analysis
                                                                                                                                                          1. Cross-Section Calculations
                                                                                                                                                            1. Background Subtraction
                                                                                                                                                              1. Plural Scattering Corrections
                                                                                                                                                              2. Limitations and Artifacts
                                                                                                                                                                1. Radiation Damage
                                                                                                                                                                  1. Specimen Thickness Effects
                                                                                                                                                                    1. Channeling Effects

                                                                                                                                                                Previous

                                                                                                                                                                5. Specimen Preparation

                                                                                                                                                                Go to top

                                                                                                                                                                Next

                                                                                                                                                                7. Advanced and Specialized Techniques