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Physics
Condensed Matter and Materials Physics
Electron Microscopy
1. Fundamentals of Electron Microscopy
2. General Instrumentation of Electron Microscopes
3. Transmission Electron Microscopy
4. Scanning Electron Microscopy
5. Specimen Preparation
6. Analytical Electron Microscopy
7. Advanced and Specialized Techniques
8. Image Processing and Data Analysis
Specimen Preparation
General Considerations
Conductivity Requirements
Avoiding Charging Artifacts
Conductive Pathways
Coating Strategies
Material-Specific Considerations
Insulators vs Conductors
Semiconductor Samples
Stability under Vacuum and Electron Beam
Beam Damage Prevention
Dose Rate Limitations
Cryogenic Protection
Vacuum Compatibility
Outgassing Considerations
Volatile Component Removal
Specimen Mounting
Mounting Media and Holders
Adhesive Selection
Mechanical Fixtures
Orientation and Labeling
Crystallographic Orientation
Sample Identification
SEM Sample Preparation
Cleaning and Drying
Removal of Contaminants
Solvent Cleaning
Ultrasonic Cleaning
Drying Techniques
Critical Point Drying
CO2 Transition Method
Apparatus and Procedure
Freeze Drying
Sublimation Process
Temperature Control
Air Drying Limitations
Surface Tension Effects
Structural Collapse
Conductive Coating
Sputter Coating
Gold Coating
Grain Size Considerations
Thickness Control
Platinum Coating
Fine Grain Structure
High Resolution Applications
Other Metal Coatings
Palladium
Chromium
Carbon Coating
Evaporation Methods
Applications and Limitations
X-ray Analysis Compatibility
Resolution Considerations
Coating Thickness Optimization
Conductivity vs Resolution
Monitoring Methods
Mounting on Stubs
Adhesives and Tapes
Carbon Tape
Silver Paint
Conductive Adhesives
Orientation for Imaging
Cross-Section Preparation
Surface Exposure
Preparation of Non-Conductive Samples
Low Voltage Imaging
Variable Pressure Techniques
Coating Alternatives
Ion Beam Coating
Plasma Treatment
TEM Sample Preparation
Requirement for Electron Transparency
Thickness Criteria
Material-Dependent Limits
Energy-Dependent Transmission
Uniformity Requirements
Thickness Variations
Edge Effects
Mechanical Thinning and Polishing
Grinding and Polishing
Abrasive Selection
Sequential Grit Reduction
Dimpling
Dimple Grinder Operation
Thickness Monitoring
Precision Ion Polishing System
Low Angle Ion Milling
Final Thinning Stage
Electropolishing
Electrolyte Selection
Material-Specific Solutions
Temperature Control
Process Control
Current Density Optimization
Voltage Control
Perforation Detection
Safety Considerations
Chemical Handling
Ventilation Requirements
Ultramicrotomy
Sectioning Techniques
Section Thickness Control
Cutting Speed Optimization
Knife Materials
Diamond Knives
Glass Knives
Sample Embedding
Resin Selection
Polymerization Control
Cryo-Ultramicrotomy
Frozen Section Preparation
Temperature Control
Ion Milling
Focused Ion Beam Milling
Site-Specific Preparation
Target Area Selection
Protective Layer Deposition
Lift-Out Techniques
In-Situ Lift-Out
Ex-Situ Lift-Out
Cross-Section Preparation
Lamella Preparation
Final Thinning
Broad Beam Ion Milling
Thinning Large Areas
Ion Gun Configuration
Angle and Energy Optimization
Artifact Minimization
Preferential Sputtering
Surface Damage
Replica Methods
Surface Replication
Carbon Replica Preparation
Plastic Replica Methods
Shadowing Techniques
Metal Shadowing
Angle and Thickness Control
Extraction Replicas
Precipitate Extraction
Chemical Etching
Powder Sample Dispersion
Grid Preparation
Support Film Selection
Grid Material Choice
Suspension and Drying
Solvent Selection
Dispersion Techniques
Concentration Optimization
Cryo-Preparation Techniques
Vitrification
Plunge Freezing
High Pressure Freezing
Freeze-Fracture and Freeze-Etching
Fracture Plane Control
Sublimation Conditions
Cryo-Transfer Systems
Contamination Prevention
Temperature Maintenance
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4. Scanning Electron Microscopy
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6. Analytical Electron Microscopy