Materials Characterization Techniques

  1. Diffraction Techniques
    1. Fundamentals of Diffraction
      1. Wave Nature of Matter
        1. De Broglie Wavelength
          1. Wave-Particle Duality
          2. Diffraction Principles
            1. Constructive and Destructive Interference
              1. Diffraction Gratings
                1. Scattering Amplitude
                2. Bragg's Law and Crystal Diffraction
                  1. Mathematical Formulation
                    1. Geometric Interpretation
                      1. Diffraction Conditions
                      2. Reciprocal Space Concepts
                        1. Reciprocal Lattice
                          1. Ewald Sphere Construction
                            1. Miller Indices and Reflection Conditions
                            2. Structure Factor
                              1. Atomic Form Factors
                                1. Systematic Absences
                                  1. Intensity Calculations
                                2. X-ray Diffraction
                                  1. X-ray Generation and Properties
                                    1. Characteristic X-rays
                                      1. Continuous X-rays
                                        1. X-ray Absorption
                                        2. Instrumentation
                                          1. X-ray Sources
                                            1. Sealed Tube Sources
                                              1. Rotating Anode Sources
                                                1. Synchrotron Radiation
                                                  1. Microfocus Sources
                                                  2. Monochromators and Filters
                                                    1. Crystal Monochromators
                                                      1. Multilayer Mirrors
                                                        1. Filters and Attenuators
                                                        2. Goniometers and Sample Stages
                                                          1. Powder Diffractometers
                                                            1. Single Crystal Diffractometers
                                                              1. Texture Goniometers
                                                              2. Detectors
                                                                1. Scintillation Counters
                                                                  1. Proportional Counters
                                                                    1. Position Sensitive Detectors
                                                                      1. Area Detectors
                                                                    2. Powder X-ray Diffraction
                                                                      1. Sample Preparation
                                                                        1. Grinding and Particle Size
                                                                          1. Preferred Orientation Effects
                                                                            1. Sample Holders
                                                                            2. Data Collection Strategies
                                                                              1. Step Scanning
                                                                                1. Continuous Scanning
                                                                                  1. Variable Counting Statistics
                                                                                  2. Qualitative Analysis
                                                                                    1. Phase Identification
                                                                                      1. Database Searching
                                                                                        1. Peak Indexing
                                                                                        2. Quantitative Analysis
                                                                                          1. Reference Intensity Ratio Method
                                                                                            1. Internal Standard Method
                                                                                              1. Rietveld Method
                                                                                            2. Single Crystal X-ray Diffraction
                                                                                              1. Crystal Selection and Mounting
                                                                                                1. Unit Cell Determination
                                                                                                  1. Data Collection Strategies
                                                                                                    1. Structure Solution Methods
                                                                                                      1. Structure Refinement
                                                                                                      2. Specialized XRD Techniques
                                                                                                        1. High Temperature XRD
                                                                                                          1. In-situ Phase Transformations
                                                                                                            1. Thermal Expansion Studies
                                                                                                            2. High Pressure XRD
                                                                                                              1. Diamond Anvil Cells
                                                                                                                1. Equation of State Studies
                                                                                                                2. Grazing Incidence XRD
                                                                                                                  1. Thin Film Analysis
                                                                                                                    1. Surface Structure
                                                                                                                    2. Small Angle X-ray Scattering
                                                                                                                      1. Nanostructure Characterization
                                                                                                                        1. Particle Size Distribution
                                                                                                                      2. Data Analysis and Interpretation
                                                                                                                        1. Peak Position Analysis
                                                                                                                          1. Lattice Parameter Determination
                                                                                                                            1. Thermal Expansion
                                                                                                                              1. Stress Analysis
                                                                                                                              2. Peak Intensity Analysis
                                                                                                                                1. Phase Quantification
                                                                                                                                  1. Preferred Orientation
                                                                                                                                    1. Atomic Occupancy
                                                                                                                                    2. Peak Profile Analysis
                                                                                                                                      1. Crystallite Size Effects
                                                                                                                                        1. Microstrain Analysis
                                                                                                                                          1. Scherrer Equation
                                                                                                                                            1. Williamson-Hall Analysis
                                                                                                                                            2. Texture Analysis
                                                                                                                                              1. Pole Figures
                                                                                                                                                1. Inverse Pole Figures
                                                                                                                                                  1. Orientation Distribution Functions
                                                                                                                                                  2. Rietveld Refinement
                                                                                                                                                    1. Profile Fitting Principles
                                                                                                                                                      1. Structural Parameters
                                                                                                                                                        1. Quality Indicators
                                                                                                                                                    2. Neutron Diffraction
                                                                                                                                                      1. Neutron Properties and Interactions
                                                                                                                                                        1. Neutron Scattering Length
                                                                                                                                                          1. Magnetic Scattering
                                                                                                                                                            1. Isotope Effects
                                                                                                                                                            2. Instrumentation
                                                                                                                                                              1. Neutron Sources
                                                                                                                                                                1. Monochromators
                                                                                                                                                                  1. Detectors
                                                                                                                                                                  2. Applications
                                                                                                                                                                    1. Magnetic Structure Determination
                                                                                                                                                                      1. Light Element Detection
                                                                                                                                                                        1. Residual Stress Analysis
                                                                                                                                                                      2. Electron Diffraction
                                                                                                                                                                        1. Electron Backscatter Diffraction
                                                                                                                                                                          1. Kikuchi Pattern Formation
                                                                                                                                                                            1. Pattern Indexing
                                                                                                                                                                              1. Orientation Mapping
                                                                                                                                                                                1. Phase Identification
                                                                                                                                                                                  1. Grain Boundary Analysis
                                                                                                                                                                                    1. Texture Analysis
                                                                                                                                                                                      1. Sample Preparation Requirements
                                                                                                                                                                                        1. Integration with SEM
                                                                                                                                                                                        2. Selected Area Electron Diffraction in TEM
                                                                                                                                                                                          1. Diffraction Pattern Formation
                                                                                                                                                                                            1. Crystal Structure Analysis
                                                                                                                                                                                              1. Orientation Relationships
                                                                                                                                                                                                1. Defect Analysis
                                                                                                                                                                                                2. Convergent Beam Electron Diffraction
                                                                                                                                                                                                  1. Higher Order Laue Zone Analysis
                                                                                                                                                                                                    1. Point Group Determination
                                                                                                                                                                                                      1. Lattice Parameter Measurement

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                                                                                                                                                                                                  4. Spectroscopic Techniques