Materials Testing and Characterization

  1. Microscopic Characterization Techniques
    1. Optical Microscopy
      1. Principles of Light Optics
        1. Resolution and Magnification
          1. Contrast Mechanisms
          2. Sample Preparation
            1. Sectioning
              1. Mounting
                1. Grinding and Polishing
                  1. Etching
                  2. Imaging Modes
                    1. Bright-Field Illumination
                      1. Dark-Field Illumination
                        1. Polarized Light Microscopy
                          1. Differential Interference Contrast
                          2. Quantitative Metallography
                            1. Grain Size Measurement
                              1. ASTM Grain Size Number
                                1. Intercept Method
                                  1. Planimetric Method
                                  2. Phase Fraction Analysis
                                    1. Point Counting
                                      1. Image Analysis Software
                                      2. Inclusion Rating
                                    2. Electron Microscopy
                                      1. Scanning Electron Microscopy
                                        1. Principles of Electron-Specimen Interactions
                                          1. Secondary Electrons
                                            1. Backscattered Electrons
                                              1. X-ray Emission
                                              2. Instrument Components
                                                1. Electron Gun
                                                  1. Electromagnetic Lenses
                                                    1. Scanning Coils
                                                      1. Detectors
                                                      2. Imaging Signals and Detectors
                                                        1. Secondary Electrons for Topography
                                                          1. Backscattered Electrons for Compositional Contrast
                                                            1. X-ray Detectors for Elemental Analysis
                                                            2. Energy-Dispersive X-ray Spectroscopy
                                                              1. Principle of Characteristic X-ray Emission
                                                                1. Qualitative Elemental Analysis
                                                                  1. Quantitative Elemental Analysis
                                                                    1. Elemental Mapping
                                                                      1. Line Scans
                                                                      2. Sample Preparation for SEM
                                                                        1. Conductive Coating
                                                                          1. Mounting and Sectioning
                                                                        2. Transmission Electron Microscopy
                                                                          1. Principles of Electron Transmission
                                                                            1. Electron Diffraction
                                                                              1. Image Formation
                                                                              2. Ultra-thin Sample Preparation
                                                                                1. Mechanical Thinning
                                                                                  1. Electropolishing
                                                                                    1. Ion Milling
                                                                                      1. Focused Ion Beam
                                                                                      2. Imaging Modes
                                                                                        1. Bright-Field Imaging
                                                                                          1. Dark-Field Imaging
                                                                                            1. High-Resolution TEM for Atomic Lattice Imaging
                                                                                            2. Selected Area Electron Diffraction for Crystallography
                                                                                              1. Analytical TEM Techniques
                                                                                                1. Energy-Dispersive X-ray Spectroscopy
                                                                                                  1. Electron Energy Loss Spectroscopy
                                                                                              2. Scanning Probe Microscopy
                                                                                                1. Atomic Force Microscopy
                                                                                                  1. Principle of Cantilever Deflection
                                                                                                    1. Imaging Modes
                                                                                                      1. Contact Mode
                                                                                                        1. Tapping Mode
                                                                                                          1. Non-Contact Mode
                                                                                                          2. Surface Topography at Nanoscale Resolution
                                                                                                            1. Force-Distance Measurements
                                                                                                              1. Phase Imaging and Mechanical Property Mapping
                                                                                                              2. Scanning Tunneling Microscopy
                                                                                                                1. Principle of Quantum Tunneling
                                                                                                                  1. Atomic Resolution on Conductive Surfaces
                                                                                                                    1. Surface Electronic Structure Mapping
                                                                                                                      1. Sample Preparation for STM

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                                                                                                                  3. Thermal Analysis Techniques

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                                                                                                                  5. Spectroscopic and Diffraction Techniques